Specification
Specification
- type Standard
- display type TFT
- resolution 0.001 µm / .01 µin
- style Skidless/ Skid (switchable)
description
description
MEASURE - Suitable for use in production environments or for incoming inspection - 3 horizontal measuring positions of the probe: 0°, -90° and +90°. - Roughness or waviness measurement with one probe (probe with removable skid). FUNCTIONS - R-profile measurement - P-profile measurement - W-profile measurement - 51 roughness parameters available - Tolerancing possible for each parameter. DATA MANAGEMENT - USB output for transferring measured values to a computer - TESA MEASUREMENT STUDIO software (optional)
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